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Press Release

Plextek announces multi-band GSM test set

Plextek has announced the availability of a low phase noise, multi-band test set that can be used for testing GSM/EDGE mobile handsets. It comprises a pair of identical two-channel transceiver modules and a front-end combiner module. The test set can process four signals in parallel allowing a handset to be tested in the presence of two interfering signals as it hands over from one base station to another.

All five of the currently allocated GSM frequency bands (GSM450, GSM850, GSM900(R), GSM1800 and GSM1900) are covered and all the required LO signals are generated within the transceiver module. The module is designed to support EDGE modulation and very low phase noise was a fundamental design goal. The total phase error caused by the integrated effect of the phase noise of all LO signals is less than 1° RMS with an added EVM of less than 4% RMS.

The test set will be offered as a finished product or on a license to manufacture basis. In both cases the test set can be customised to meet specific client requirements. The test set will be one of Plextek's exhibits at the GSM World Congress in Cannes, 23-27 February (Hall 2, Stand G46).

Issued 02/02/2004