Press Release
Plextek announces multi-band GSM test set
Plextek has announced the availability of a low phase noise, multi-band
test set that can be used for testing GSM/EDGE
mobile handsets. It comprises a pair of identical two-channel transceiver
modules and a front-end combiner module. The test
set can process four signals in parallel allowing a handset to be tested
in the presence of two interfering signals as it hands over from one
base station to another.
All five of the currently allocated GSM frequency bands (GSM450, GSM850,
GSM900(R), GSM1800 and GSM1900) are covered and all the required LO
signals are generated within the transceiver module. The module is designed
to support EDGE modulation and very low phase noise was a fundamental
design goal. The total phase error caused by the integrated effect of
the phase noise of all LO signals is less than 1° RMS with an added
EVM of less than 4% RMS.
The test set will be offered as a finished product or on a license
to manufacture basis. In both cases the test set can be customised to
meet specific client requirements. The test set will be one of Plextek's
exhibits at the GSM World Congress in Cannes, 23-27 February (Hall 2,
Stand G46).
Issued 02/02/2004